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MOS linear region impedance curvature correction
A system and method to correct or cancel MOS linear region impedance curvature employing an analog solution to trim out the MOS linear region impedance curvature...
Intermediate semiconductor device structures
A method of forming a metal pattern on a dielectric layer that comprises forming at least one trench in a dielectric layer formed from a photosensitive,...
Methods for stacking wire-bonded integrated circuit dice on flip-chip
bonded integrated circuit dice
An inventive electronic device, such as a multi-chip module (MCM), a Single In-line Memory Module (SIMM), or a Dual In-line Memory Module (DIMM), includes a...
Layered magnetic structures having improved surface planarity for bit
The present invention provides a method of fabricating a portion of a memory cell, the method comprising providing a first conductor in a trench which is...
Zr-- Sn--Ti--O films
A dielectric film containing Zr--Sn--Ti--O formed by atomic layer deposition using a TiI.sub.4 precursor and a method of fabricating such a dielectric film...
Memory cells and select gates of NAND memory arrays
A select gate of a NAND memory array has a first dielectric layer formed on a semiconductor substrate. A first conductive layer is formed on the first dielectric...
Back-side trapped non-volatile memory device
Non-volatile memory devices and arrays are described that utilize back-side trapped floating node memory cells with band-gap engineered gate stacks with...
Multilayer dielectric tunnel barrier used in magnetic tunnel junction
devices, and its method of fabrication
A multilayer dielectric tunnel barrier structure and a method for its formation which may be used in non-volatile magnetic memory elements comprises an ALD...
Methods for pixel binning in an image sensor
Embodiments provide structures and methods for binning pixel signals of a pixel array. Pixel signals for pixels in an element of the array are binned...
Masking without photolithography during the formation of a semiconductor
A method for forming a semiconductor device comprises forming a dielectric layer over a semiconductor wafer substrate assembly having closely spaced regions,...
Plasma processing, deposition, and ALD methods
A plasma processing method includes providing a substrate in a processing chamber, the substrate having a surface, and generating a plasma in the processing...
Atomic layer deposition methods
A first precursor gas is flowed to the substrate within the chamber effective to form a first monolayer on the substrate. A second precursor gas different in...
Method for making integrated circuits
Integrated circuits, the key components in thousands of electronic and computer products, include interconnected networks of electrical components. The...
High aspect ratio contact structure with reduced silicon consumption
A high aspect ratio contact structure formed over a junction region in a silicon substrate comprises a titanium interspersed with titanium silicide layer that is...
Methods of forming trench isolation regions
The invention includes methods of forming trench isolation regions. In one implementation, a masking material is formed over a semiconductor substrate. The...
Capacitor compatible with high dielectric constant materials having a low
contact resistance layer and the...
A storage cell capacitor and a method for forming the storage cell capacitor having a storage node electrode including a barrier layer interposed between a...
Microelectronic imaging units and methods of manufacturing microelectronic
Methods for manufacturing microelectronic imaging units and microelectronic imaging units that are formed using such methods are disclosed herein. In one...
Optimized transistor for imager device
An imager device that has mitigated dark current leakage and punch-through protection. The transistor associated with the photoconversion device is formed with a...
Resist exposure system and method of forming a pattern on a resist
A resist exposure system and a method of forming a pattern on a resist are provided and include an exposure source, a photoresist composition, and a mask...
Chemical-mechanical polishing methods
A chemical-mechanical polishing (CMP) method includes applying a solid abrasive material to a substrate, polishing the substrate, flocculating at least a portion...
Fixed-abrasive chemical-mechanical planarization of titanium nitride
Planarizing solutions, and their methods of use, for removing titanium nitride from the surface of a substrate using a fixed-abrasive planarizing pad. The...
Program failure recovery
Methods and apparatus are provided. A method of operating a memory device includes detecting a programming failure at a first location of a memory array,...
Methods of forming radiation-patterning tools; carrier waves and computer
The invention includes a method for placement of sidelobe inhibitors on a radiation-patterning tool. Elements of the tool are represented by design features in a...
Memory block reallocation in a flash memory device
A non-volatile memory device has the pages of a certain memory block reallocated to other blocks in order to increase decrease disturb and increase reliability....
Actively driven V.sub.REF for input buffer noise immunity
A memory device including a circuit for actively driving a reference voltage in a memory device is disclosed. A circuit integrated in a memory device and coupled...
Memory device having terminals for transferring multiple types of data
A device includes a number of terminals for transferring input data and output data to and from a memory array. The memory device includes an auxiliary circuit...
Mimicking program verify drain resistance in a memory device
A selected word line is biased with a program verify voltage. A predetermined quantity of unselected word lines that are between the selected word line and the...
Programming method to reduce gate coupling interference for non-volatile
A non-volatile memory device and programming process is described that compensates for coupling effects on threshold gate voltages of adjacent floating gate or...
Method and apparatus for testing image sensors
Methods and apparatuses for testing image sensors are disclosed. Desirable apparatuses of the present invention include image sensor testing devices comprising a...
System and method for collecting images of a monitored device
A system and method for collecting images of monitored devices, such as utility meters for electricity, gas and water, captures a digital image of a monitored...
Apparatus and methods for regulated voltage
An electronic system according to various aspects of the present invention includes a memory and a supply regulation circuit having a regulated output to provide...
The invention includes a method of forming a metal-containing film over a surface of a semiconductor substrate. The surface is exposed to a supercritical fluid....
Module assembly for stacked BGA packages
Ball grid array packages that can be stacked to form highly dense components and the method for stacking ball grid arrays are disclosed. The ball grid array...
Scalable Flash/NV structures and devices with extended endurance
Devices and methods are provided with respect to a gate stack for a nonvolatile structure. According to one aspect, a gate stack is provided. One embodiment of...
Isolation structures for preventing photons and carriers from reaching
active areas and methods of formation
Regions of an integrated circuit are isolated by a structure that includes at least one isolating trench on the periphery of an active area. The trench is deep,...
Method of forming a structure over a semiconductor substrate
The invention includes a method of forming a structure over a semiconductor substrate. A silicon dioxide containing layer is formed across at least some of the...
Disposable pillars for contact formation
Sacrificial plugs for forming contacts in integrated circuits, as well as methods of forming connections in integrated circuit arrays are disclosed. Various...
Atomic layer deposition of Zr.sub.3N.sub.4/ZrO.sub.2 films as gate
The use of atomic layer deposition (ALD) to form a dielectric layer of zirconium nitride (Zr.sub.3N.sub.4) and zirconium oxide (ZrO.sub.2) and a method of...
Ball grid array packages with thermally conductive containers
Ball grid array packages for semiconductor die include a thermally conductive container and a substrate that substantially enclose a semiconductor die. The die...
Methods of gas delivery for deposition processes and methods of depositing
material on a substrate
Methods for depositing material onto workpieces, methods of controlling the delivery of gases in deposition processes, and apparatus for depositing materials...
Compositions for dissolution of low-k dielectric films, and methods of use
An improved composition and method for cleaning the surface of a semiconductor wafer are provided. The composition can be used to selectively remove a low-k...
Method for forming a storage cell capacitor compatible with high
dielectric constant materials
An integrated circuit structure includes a digit line and an electrode adapted to be part of a storage cell capacitor and includes a barrier layer interposed...
Measure controlled delay with duty cycle control
The disclosed embodiments relate to circuits that produce synchronized output signals. More specifically, there is provided a synchronization circuit adapted to...
Method and apparatus for high performance branching in pipelined
A pipelined processor includes a branch acceleration technique which is based on an improved branch cache. The improved branch cache minimizes or eliminates...
Active termination control
A method and apparatus are provided for active termination control in a memory by a module register providing an active termination control signal to the memory....
Pre-emphasis for strobe signals in memory device
Some embodiments of the invention include a memory device having a number of data terminals for transferring data signals and a number of strobe terminals for...
Distributed write data drivers for burst access memories
An address strobe latches a first address. A burst cycle increments the address internally with additional address strobes. A new memory address is only required...
Resistive memory device
A system having a memory cell. In certain embodiments, the memory cell includes a resistive memory element, an access transistor having a gate, a first terminal,...
High dynamic range imager with a rolling shutter
A high dynamic range imager operates pixels utilizing at least a short integration period and a long integration period. The pixel reading circuits of the imager...
Systems and methods for reducing artifacts caused by illuminant flicker
Methods for reducing artifacts caused by illuminant flicker are provided. One such method comprises: providing pixel circuits; and operating the pixel circuits...