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Patent # Description
US-7,276,393 Microelectronic imaging units and methods of manufacturing microelectronic imaging units
Methods for manufacturing microelectronic imaging units and microelectronic imaging units that are formed using such methods are disclosed herein. In one...
US-7,276,387 Castellation wafer level packaging of integrated circuit chips
Systems and methods for packaging integrated circuit chips in castellation wafer level packaging are provided. The active circuit areas of the chips are coupled...
US-7,276,315 Methods for generating or designing sidelobe inhibitors for radiation patterning tools
Design methods and a computer-readable medium having computer-executable instructions thereon for sidelobe suppression in a radiation-patterning tool or mask....
US-7,275,925 Apparatus for stereolithographic processing of components and assemblies
An apparatus for providing gross location, planarization, and mechanical restraint to one or more electronic components such as semiconductor dice to be...
US-7,275,676 Apparatus for locating conductive spheres utilizing screen and hopper of solder balls
Apparatus for placing conductive spheres on prefluxed bond pads of a substrate using a stencil plate with a pattern of through-holes positioned over the bond...
US-7,275,190 Memory block quality identification in a memory device
If a memory block in a flash memory device is found to have a defect, a memory block quality indication is generated in response to the type of memory defect....
US-7,275,172 Apparatus and method for generating a delayed clock signal
An apparatus and method for generating a delayed clock signal is provided. The clock signal generator includes a synchronizing circuit for generating an output...
US-7,275,130 Method and system for dynamically operating memory in a power-saving error correcting mode
A scrubbing controller used with a DRAM stores data in an error correcting code format. The system then uses a memory control state machine and associated timer...
US-7,274,838 Method for fabricating an optical integrated circuit
The present technique relates to a method for fabricating an optical integrated circuit amplifier with another type of optical integrated circuit. In optical...
US-7,274,611 Method and architecture to calibrate read operations in synchronous flash memory
Architecture to calibrate read operations in non-volatile memory devices. In one embodiment, a synchronous flash memory is disclosed. The synchronous flash...
US-7,274,609 High speed redundant data sensing method and apparatus
An apparatus and method for coupling a normal bit line pair and a second bit line pair onto a desired bit line pair are described. This method comprises driving...
US-7,274,607 Bitline exclusion in verification operation
Methods and apparatuses for disabling a bad bitline for verification operations, and for determining whether a programming operation have failed, include setting...
US-7,274,606 Low power chip select (CS) latency option
A system and method to reduce standby currents in input buffers in an electronic device (e.g., a memory device) is disclosed. The input buffers may be activated...
US-7,274,605 Per-bit set-up and hold time adjustment for double-data rate synchronous DRAM
A synchronous double-data-rate semiconductor memory device is adapted to receive write data on both the rising and falling edges of a data strobe signal derived...
US-7,274,604 Memory device having terminals for transferring multiple types of data
A memory device includes a number of terminals for transferring input data and output data to and from a memory array. The memory device includes an auxiliary...
US-7,274,600 NAND flash memory with read and verification threshold uniformity
A plurality of cells in a flash memory device are coupled together in a series configuration, as in a NAND flash memory. A position of a first accessed cell is...
US-7,274,596 Reduction of adjacent floating gate data pattern sensitivity
The method for programming non-volatile memory cells erases the memory cells to be programmed. The memory cells are then programmed to a reduced floating gate...
US-7,274,591 Write current shunting compensation
A magnetic random access memory (MRAM) is compensated for write current shunting by varying the bit size of each MRAM cell with position along the write line....
US-7,274,582 High speed data bus
The invention comprises data processing systems and components thereof. Such systems may include a memory controller, a plurality of memory devices, a data bus...
US-7,274,397 Image sensor with active reset and randomly addressable pixels
An imaging array having one or more columns of pixels is disclosed. Each pixel includes a photodiode including first and second terminals, a local reset circuit...
US-7,274,396 Image sensors with isolated flushed pixel reset
Techniques for use with image sensors include transferring a signal level from an active sensor pixel to a readout circuit, performing a flushed reset of the...
US-7,274,319 Ramp generators for imager analog-to-digital converters
An imager with an analog-to-digital converter having at least one ramp generator that precisely and efficiently produces the desired ramp voltages required by...
US-7,274,239 Method and apparatus to set a tuning range for an analog delay
An apparatus and method for an analog fine delay line, a hybrid delay line, and a delay locked loop (DLL) is described. In the DLL, a coarse phase detector...
US-7,274,237 Measure control delay and method having latching circuit integral with delay circuit
A measure control delay includes a measuring delay line and a signal generating delay line, each of which include a plurality of series-connected delay units. A...
US-7,274,236 Variable delay line with multiple hierarchy
Disclosed herein are improved, simplified designs for a hierarchical delay line (HDL). The HDL is useful in providing precise phase control between an input...
US-7,274,228 Method and apparatus for digital phase generation at high frequencies
An apparatus and method for generating phase related clocks, includes delaying a clock input by a cycle delay magnitude to generate a cycle delay signal and N...
US-7,274,221 Comparator circuit
An improved comparator circuit and associated methods are disclosed. In one embodiment, the comparator circuit comprises two voltage-to-time converter circuits,...
US-7,274,220 Method and apparatus for amplifying a regulated differential signal to a higher voltage
A sense amplifier for use in a memory device and in a memory-resident system. The sense amplifier operates on a lower voltage consistent with the voltage range...
US-7,274,205 System and method for testing devices utilizing capacitively coupled signaling
An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal...
US-7,274,204 System and method for testing devices utilizing capacitively coupled signaling
An apparatus and method for testing a semiconductor device in an AC test regime. The test apparatus includes a test plate capacitively couple to the signal...
US-7,274,201 Method and system for stressing semiconductor wafers during burn-in
A method and system for testing a plurality of semiconductor dice on a semiconductor wafer during burn-in includes forming a plurality of semiconductor dice with...
US-7,274,197 Contact system for interfacing a semiconductor wafer to an electrical tester
Disclosed herein are exemplary embodiments of a contact system (referred to as a "Z-block") for interfacing a semiconductor wafer to an electrical tester, and...
US-7,274,138 Spacers for field emission displays
The disclosed method for forming a field emission display includes forming a cathode and an anode, forming a plurality of photoresist posts over the cathode, and...
US-7,274,095 Interposers with receptacles for receiving semiconductor devices and assemblies and packages including such...
A semiconductor device package interposer including a receptacle extending substantially therethrough. Methods for assembling the interposer with one or more...
US-7,274,094 Leadless packaging for image sensor devices
A leadless image sensor package and methods for its assembly. In a first embodiment, an image sensor chip is mounted within a bottom-side cavity of a package...
US-7,274,086 Memory device power distribution in memory assemblies
Memory assemblies include memory chips having chip bond pads on both sides of the memory chip shorted to each other by a single lead of a leadframe. The memory...
US-7,274,076 Threshold voltage adjustment for long channel transistors
A threshold voltage adjusted long-channel transistor fabricated according to short-channel transistor processes is described. The threshold-adjusted transistor...
US-7,274,068 Ballistic direct injection NROM cell on strained silicon structures
A nitride read only memory cell comprising a silicon-germanium layer with a pair of source/drain regions. A strained silicon layer is formed overlying the...
US-7,274,067 Service programmable logic arrays with low tunnel barrier interpoly insulators
Structures and methods for in service programmable logic arrays with low tunnel barrier interpoly insulators are provided. The in-service programmable logic...
US-7,274,065 Source lines for NAND memory devices
A NAND memory device has a source line connected to two or more columns of serially-connected floating-gate transistors. The source line includes a first...
US-7,274,061 Capacitor constructions
The invention includes methods of forming rugged electrically conductive surfaces. In one method, a layer is formed across a substrate and subsequently at least...
US-7,274,059 Capacitor constructions
The invention includes methods of forming rugged electrically conductive surfaces. In one method, a layer is formed across a substrate and subsequently at least...
US-7,274,056 Semiconductor constructions
The invention includes a semiconductor construction having a pair of channel regions that have sub-regions doped with indium and surrounded by boron. A pair of...
US-7,274,054 Dual capacitor structure for imagers and method of formation
CMOS and CCD imaging devices comprising different in-pixel capacitors and peripheral capacitors and methods of formation are disclosed. The capacitors used in...
US-7,274,049 Semiconductor assemblies
The invention includes a semiconductor processing method wherein an insulative mass is formed across a first electrical node and a second electrical node. The...
US-7,274,034 Resistance variable memory device with sputtered metal-chalcogenide region and method of fabrication
A chalcogenide-based programmable conductor memory device and method of forming the device, wherein a chalcogenide glass region is provided with a plurality of...
US-7,273,817 Conditioning of a reaction chamber
A method is provided for forming polymer on an interior surface of a reaction chamber. A polymer-forming gas is introduced into the chamber during the etching of...
US-7,273,816 Methods for removal of organic materials
The invention includes methods of forming capacitor structures and removing organic material. An organic material, such as a photoresist, is disposed on a...
US-7,273,809 Method of fabricating a conductive path in a semiconductor device
A method for fabricating an ultra-small electrode or plug contact for use in chalcogenide memory cells specifically, and in semiconductor devices generally, in...
US-7,273,802 Methods for consolidating previously unconsolidated conductive material to form conductive structures or...
Methods for fabricating conductive structures on contact pads of semiconductor device components or other electronic components and for securing conductive...
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