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Patent # Description
US-7,212,436 Multiple level programming in a non-volatile memory device
The programming method of the present invention minimizes program disturb in a non-volatile memory device by initially programming a lower page of a memory...
US-7,212,435 Minimizing adjacent wordline disturb in a memory device
A selected wordline that is coupled to cells for programming is biased with a programming voltage. The unselected wordlines that are adjacent to the selected...
US-7,212,394 Apparatus and method for banding the interior substrate of a tubular device and the products formed therefrom
Apparatus and method for depositing a banding material on the interior substrate of a tubular device, and the products formed therefrom. The tubular device is,...
US-7,212,057 Measure-controlled circuit with frequency control
A delay locked circuit has multiple paths for receiving an external signal. One path measures a timing of the external signal during a measurement. Another path...
US-7,212,053 Measure-initialized delay locked loop with live measurement
A method of operating a delay locked loop is comprised of producing a first output signal in response to a first lock point. A new lock point is measured, or...
US-7,212,020 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are...
US-7,212,013 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a...
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network...
US-7,211,997 Planarity diagnostic system, E.G., for microelectronic component test systems
Methods of verifying planarity of a microelectronic component support of a microelectronic component test system with respect to a head of the test system are...
US-7,211,855 Intermediate semiconductor device structure including multiple photoresist layers
The present invention prevents cross-linking between multiple resists that are used in the fabrication of a semiconductor device. In order to prevent resists in...
US-7,211,849 Protective layers for MRAM devices
A method of forming a magnetic random access memory (MRAM) using a sacrificial cap layer on top of the memory cells and the structure resulting therefrom are...
US-7,211,848 Masked spacer etching for imagers
The invention relates to a dual masked spacer etch for improved dark current performance in imagers. After deposition of spacer material such as oxide, N-channel...
US-7,211,512 Selective electroless-plated copper metallization
Structures and methods are provided which include a selective electroless copper metallization. The present invention includes a novel methodology for forming...
US-7,211,499 Methods of forming silicon dioxide layers, and methods of forming trench isolation regions
A method of forming a silicon dioxide layer includes forming a high density plasma proximate a substrate, the plasma comprising silicon dioxide precursors;...
US-7,211,492 Self aligned metal gates on high-k dielectrics
A method for forming a transistor including a self aligned metal gate is provided. According to various method embodiments, a high-k gate dielectric is formed on...
US-7,211,479 Silicon rich barrier layers for integrated circuit devices
Semiconductor devices and memory cells are formed using silicon rich barrier layers to prevent diffusion of dopants from differently doped polysilicon films to...
US-7,211,453 Method and apparatus for personalization of semiconductor
A system for making small modifications to the pattern in standard processed semiconductor devices. The modifications are made to create a small variable part of...
US-7,211,200 Manufacture and cleaning of a semiconductor
Metal nitride and metal oxynitride extrusions often form on metal silicides. These extrusions can cause short circuits and degrade processing yields. The present...
US-7,210,989 Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic...
Machines with solution dispensers and methods of using such machines for chemical-mechanical planarization and/or electrochemical-mechanical ...
US-7,210,985 Shaped polishing pads for beveling microfeature workpiece edges, and associated systems and methods
Systems and methods for beveling microfeature workpiece edges are disclosed. A system in accordance with one embodiment is configured to remove material from a...
US-7,210,984 Shaped polishing pads for beveling microfeature workpiece edges, and associated systems and methods
Systems and methods for beveling microfeature workpiece edges are disclosed. A system in accordance with one embodiment is configured to remove material from a...
US-7,210,581 Apparatus for magnetically separating integrated circuit devices
A method and apparatus of separating integrated circuit (IC) devices according to magnetic properties of the devices is disclosed. A plurality of IC devices are...
US-7,210,224 Method for forming an antifuse
An antifuse including a bottom plate having a plurality of longitudinal members arranged substantially parallel to a first axis, a dielectric layer formed on the...
US-7,210,110 Method for determining a matched routing arrangement for semiconductor devices
The present invention relates to a method for determining a matched routing netlist for a semiconductor device. In a particular embodiment, a topological plan...
US-7,210,059 System and method for on-board diagnostics of memory modules
A memory hub includes an on-board diagnostic engine through which diagnostic testing and evaluation of the memory system can be performed. The memory hub...
US-7,210,020 Continuous interleave burst access
A system is described which uses a burst access memory and a memory controller to anticipate the memory address to be used in future data read operations as...
US-7,209,794 Controller with interface attachment
A controller with attachments for controlling specific electronic circuits is disclosed. Each attachment has a connector connectable to the electronic circuit to...
US-7,209,405 Memory device and method having multiple internal data buses and memory bank interleaving
A memory device and method receives write data through a unidirectional downstream bus and outputs read data through a unidirectional upstream bus. The...
US-7,209,403 Enhanced fuse configurations for low-voltage flash memories
An enhanced fuse circuit is discussed that advances redundancy techniques in integrated circuits. The enhanced fuse circuit uses a single nonvolatile fuse and a...
US-7,209,387 Non-volatile programmable fuse apparatus in a flash memory with pairs of supercells programmed in a...
The non-volatile, programmable fuse apparatus has a pair of p-channel transistors coupled in a latch configuration. A supercell is coupled between each...
US-7,209,378 Columnar 1T-N memory cell structure
A memory array architecture incorporates certain advantages from both cross-point and 1T-1Cell architectures during reading operations. The fast read-time and...
US-7,209,359 Universal memory module/PCB storage, transport, automation handling tray
An adjustable tray for a semiconductor device, and method of using the tray for handling the device, are provided. Each tray comprises a front frame segment and...
US-7,209,173 Methods of operating photodiode-type pixel and imager device
Operation for global electronic shutter photodiode-type pixels. In a first mode of operation, lag is reduced through global reset of the photodiode array and...
US-7,209,168 Defective pixel correction method and system
A defective pixel detection and correction mechanism for use in an image sensor integrated circuit determines whether a current pixel is a defective pixel in a...
US-7,209,166 Wide dynamic range operation for CMOS sensor with freeze-frame shutter
Wide dynamic range operation is used to write a signal in a freeze-frame pixel into the memory twice, first after short integration and then after long...
US-7,208,989 Synchronous clock generator including duty cycle correction
A clock generator for generating an output clock signal synchronized with an input clock signal and having a corrected duty cycle. The clock generator includes...
US-7,208,986 Measure-controlled delay circuits with reduced phase error
Measure-controlled delay (MCD) circuits are provided for synchronizing an output clock to an input clock. In response to triggering of a measure circuit, sample...
US-7,208,959 Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a...
Methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network analyzer in...
US-7,208,935 Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a...
Apparatus and methods are provided for measuring the potential for mutual coupling in an integrated circuit package of any type or configuration using a network...
US-7,208,839 Semiconductor component assemblies having interconnects
Methods relating to forming interconnects through injection of conductive materials, to fabricating semiconductor component assemblies, and to resulting...
US-7,208,836 Integrated circuitry and a semiconductor processing method of forming a series of conductive lines
A semiconductor processing method of forming a plurality of conductive lines includes, a) providing a substrate; b) providing a first conductive material layer...
US-7,208,828 Semiconductor package with wire bonded stacked dice and multi-layer metal bumps
A semiconductor package includes a substrate formed of a board material, a semiconductor die bonded to the substrate, and an encapsulant on the die. The package...
US-7,208,813 Capacitor layout orientation
The disclosed embodiments relate to a plurality of capacitive memory elements disposed on a substrate. The substrate may comprise a processor, a memory device or...
US-7,208,805 Structures comprising a layer free of nitrogen between silicon nitride and photoresist
The invention includes a semiconductor processing method. A first material comprising silicon and nitrogen is formed. A second material is formed over the first...
US-7,208,804 Crystalline or amorphous medium-K gate oxides, Y.sub.20.sub.3 and Gd.sub.20.sub.3
A gate oxide and method of fabricating a gate oxide that produces a more reliable and thinner equivalent oxide thickness than conventional SiO.sub.2 gate oxides...
US-7,208,793 Scalable integrated logic and non-volatile memory
A scalable, logic transistor has a pair of doped regions for the drain and source. A gate insulator layer is formed over the substrate and between the drain and...
US-7,208,783 Optical enhancement of integrated circuit photodetectors
A semiconductor integrated circuit structure and method for fabricating. The semiconductor integrated circuit structure includes a light sensitive device...
US-7,208,758 Dynamic integrated circuit clusters, modules including same and methods of fabricating
A semiconductor wafer or other bulk semiconductor substrate having a plurality of dice thereon is manufactured using conventional processing techniques. The...
US-7,208,412 Method of forming metal oxide and semimetal oxide
The invention includes methods of forming metal oxide and/or semimetal oxide. The invention can include formation of at least one metal-and-halogen-containing...
US-7,208,410 Methods relating to forming interconnects
Methods relating to forming interconnects through injection of conductive materials, to fabricating semiconductor component assemblies, and to resulting...
US-7,208,407 Flash memory cells with reduced distances between cell elements
An anti-reflective coating (ARC) is formed over the various layers involved in a cell fabrication process. The ARC is selectively etched such that the edges of...
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